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XRF (X-Ray Fluorescence coating thickness instrument)萤光测厚仪

(X-Ray Fluorescence coating thickness instrument)萤光测厚仪可透过元素之特徵萤光，达到非破坏性量测金属镀层厚度及成分比例 (例如:镍/钯/金/银/锡/铜厚度及化学镍之磷含量)